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Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors24th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSISOC), Sep 2016, Tallinn, Estonia. pp.41-59, ⟨10.1007/978-3-319-67104-8_3⟩
Conference papers
hal-01675198v1
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