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authFullName_s : Vincent Beroulle
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Laser-Induced Fault Effects in Security-Dedicated Circuits

Vincent Beroulle , Philippe Candelier , Stephan de Castro , Giorgio Di Natale , Jean-Max Dutertre , et al.
VLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Conference papers hal-01383737v1
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FMEA on Critical Systems: a Cross-layer Approach based on High-Level Models

Julie Roux , Katell Morin-Allory , Vincent Beroulle , Lilian Bossuet , Frederic Cezilly , et al.
29th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2021, Singapore, Singapore. pp.113-134
Conference papers hal-04419787v2